NDLI: Efficiency evaluation of parametric failure mitigation techniques for reliable SRAM operation

Content Provider	IEEE Xplore Digital Library
Author	Vatajelu, E.I. Figueras, J.
Copyright Year	2012
Description	Author affiliation: Department of Electronic Engineering, Universitat Politecnica de Catalunya (UPC), Barcelona, Spain (Vatajelu, E.I.; Figueras, J.)
Abstract	The efficiency of different assist techniques for SRAM cell functionality improvement under the influence of random process variation is studied in this paper. The sensitivity of an SRAM cell functionality metrics when using control voltage level assist techniques is analyzed in read and write operation modes. The efficiency of the assist techniques is estimated by means of parametric analysis. The purpose is to find the degree of functionality metric improvement in each operation mode. The Acceptance Region concept is used for parametric analysis of SRAM cell functionality under random threshold voltage variations. In order to increase the reliability of the SRAM several assist techniques, chosen among the most efficient ones for each operation mode, are considered. This analysis offers a qualitative indication of the cell's functionality improvement by means of the efficient computation of a metric in parameter domain analysis. The results are proven to have high correlation with the ones obtained by means of the classical Monte Carlo simulations with significant savings in comparing different assist techniques.
Starting Page	1343
Ending Page	1348
File Size	358666
Page Count	6
File Format	PDF
ISBN	9781457721458
ISSN	15301591
DOI	10.1109/DATE.2012.6176700
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-03-12
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	European Design Automation Association (EDAA)
Subject Keyword	Random access memory Measurement Voltage control Support vector machines Computer architecture Reliability Microprocessors Spec Violation Metric SRAM Cell Voltage Level Assist Techniques
Content Type	Text
Resource Type	Article

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