NDLI: Comparison of Self-Timed Ring and Inverter Ring Oscillators as entropy sources in FPGAs

Content Provider	IEEE Xplore Digital Library
Author	Cherkaoui, A. Fischer, V. Aubert, A. Fesquet, L.
Copyright Year	2012
Description	Author affiliation: Hubert Curien Laboratory, 18 rue Prof. Lauras, St.-Etienne, France (Cherkaoui, A.; Fischer, V.; Aubert, A.) \|\| TIMA Laboratory, 46, Avenue Felix Viallet, Grenoble, FRANCE (Fesquet, L.)
Abstract	Many True Random Numbers Generators (TRNG) use jittery clocks generated in ring oscillators as a source of entropy. This is especially the case in Field Programmable Gate Arrays (FPGA), where sources of randomness are very limited. Inverter Ring Oscillators (IRO) are relatively well characterized as entropy sources. However, it is known that they are very sensitive to working conditions. This fact makes them vulnerable to attacks. On the other hand, Self-Timed Rings (STR) are currently considered as a promising solution to generate robust clock signals. Although many studies deal with their temporal behavior and robustness in Application Specific Integrated Circuits (ASIC), equivalent study does not exist for FPGAs. Furthermore, these oscillators were not analyzed and characterized as entropy sources aimed at TRNG design. In this paper, we analyze STRs as entropy sources for TRNGs implemented in FPGAs. Next, we compare STRs and IROs when serving as sources of randomness. We show that STRs represent very interesting alternative to IROs: they are more robust to environmental fluctuations and they exhibit lower extra-device frequency variations.
Starting Page	1325
Ending Page	1330
File Size	637068
Page Count	6
File Format	PDF
ISBN	9781457721458
ISSN	15301591
DOI	10.1109/DATE.2012.6176697
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-03-12
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	European Design Automation Association (EDAA)
Subject Keyword	Jitter Frequency measurement Field programmable gate arrays Propagation delay Voltage measurement Robustness Oscillators
Content Type	Text
Resource Type	Article

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