NDLI: Development of A Haptic User Interface for Surface Sensing and Nanomanipulation Based on Atomic Force Microscope

Content Provider	IEEE Xplore Digital Library
Author	Lianqing Liu Niandong Jiao Xiaojun Tian Zaili Dong Ning Xi Li, W.J. Yuechao Wang
Copyright Year	2006
Description	Author affiliation: Robot. Lab., Chinese Acad. of Sci, Shenyang (Lianqing Liu; Niandong Jiao; Xiaojun Tian; Zaili Dong; Ning Xi; Li, W.J.; Yuechao Wang)
Abstract	The standard application of atomic force microscope (AFM) is observation with subnanometer resolution. As development of nano-tech, AFM has also become popular as a simple manipulation tool. We have proved that developing a haptic user interface (HUI) can significantly improve these functions of AFM. When going on observation, under the assistance of HUI, the user can not only observe surface characters through the scanning image, meanwhile, he can also "touch" the surface with a force proportional to the imaging signal on his hand, which help to deepen people's understanding to surface characters. HUI can work for surface sensing online or offline, as long as the imaging signals could be obtained. Changing the observation mode of AFM from only imaging to both imaging and sensing. When going on nanomanipulation, through HUI the user can not only feel the real-time operation force, furthermore he can directly control the tip motion of AFM. this significantly improved the efficiency and effectiveness of AFM based nanomanipulation.
Starting Page	900
Ending Page	904
File Size	5333106
Page Count	5
File Format	PDF
ISBN	1424401399
DOI	10.1109/NEMS.2006.334561
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-01-18
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Atomic force microscopy Haptic interfaces User interfaces Motion control Force feedback Ethernet networks Imaging phantoms Systems engineering and theory Robot sensing systems Laboratories Nanomanipulation AFM Force Feedback
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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