NDLI: Study of CoFe alloy nano thin films for temperature sensing

Content Provider	IEEE Xplore Digital Library
Author	Kumar, V. Yadav, M.S. Pant, R.P.
Copyright Year	2010
Description	Author affiliation: Dept. of Physics, Kurukshetra Univ., Haryana, India (Pant, R.P.) \|\| Dept. of Physics, DCR Univ. Sci. Tech. Murthal, Haryana, India (Kumar, V.) \|\| EPR & Magnetic Fluid Section, National Physical Laboratory, New Delhi, India (Yadav, M.S.)
Abstract	Magnetic metal alloy particles of CoFe were grown by chemical method and the crystalline phase was confirmed by X-ray diffraction pattern. The thin film of dimensions 10mm × 10mm × 100nm (length x breadth x thickness) of this material was developed using vacuum vapour deposition technique. The V-I measurements of the thin film was done at different temperatures in the range 160 K to 298 K. A large variation in the electrical resistance of developed magnetic alloy thin film was observed with change of temperature. Resistance of thin film decreases exponentially as we move towards higher temperatures.
Starting Page	763
Ending Page	766
File Size	707327
Page Count	4
File Format	PDF
ISBN	9781424481705
ISSN	19300395
e-ISBN	9781424481699
e-ISBN	9781424481682
DOI	10.1109/ICSENS.2010.5690786
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-11-01
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Materials X-ray diffraction Temperature measurement Temperature sensors Resistance Metals Diffraction
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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