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Content Provider | IEEE Xplore Digital Library |
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Author | Alioto, M. Leblebici, Y. |
Copyright Year | 2009 |
Description | Author affiliation: Microelectronic Systems Laboratory, Ecole Polytechnique Fédérale de Lausanne, Switzerland (Leblebici, Y.) || Department of Information Engineering, University of Siena, Italy (Alioto, M.) |
Abstract | In this paper, ultra-low power current-mode subthreshold MOS Current-mode Logic (MCML) gates are discussed from a modeling and design perspective. A detailed analysis of the DC characteristics is presented, and the effect of process variations is analyzed in depth. Analysis allows for understanding the main limits of sub-threshold MCML gates in terms of delay/power variability. In particular, it is shown that process variations strongly affect the DC characteristics, and moderately impact delay and power consumption. Interestingly, delay and power variations are shown to be significantly reduced compared to typical values encountered in standard subthreshold CMOS logic. Criteria to size transistors to keep variations within assigned bounds are also derived. Results of Monte Carlo simulations with a 65-nm CMOS technology are reported to validate theoretical results. |
Starting Page | 2557 |
Ending Page | 2560 |
File Size | 874879 |
Page Count | 4 |
File Format | |
ISBN | 9781424438273 |
DOI | 10.1109/ISCAS.2009.5118323 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2009-05-24 |
Publisher Place | Taiwan |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | CMOS logic circuits Delay CMOS technology Energy consumption Threshold voltage Logic circuits Semiconductor device modeling MOSFETs Information analysis Design engineering |
Content Type | Text |
Resource Type | Article |
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