NDLI: Temperature compensation in combination selection based mismatch calibration

Content Provider	IEEE Xplore Digital Library
Author	Marku, J. Poikonen, J. Paasio, A.
Copyright Year	2009
Description	Author affiliation: University of Turku, Department of Information Technology, Microelectronics Laboratory, FIN-20014, Turku, Finland (Marku, J.; Poikonen, J.; Paasio, A.)
Abstract	The temperature behaviour of a combination selection based mismatch calibration is discussed. The functionality of the calibration structure has already been presented. Clear benefits in implementation area and accuracy can be reached when using mismatch calibration based on combination selection of minimum-sized transistors. However, with the used high accuracy requirements, the effects of temperature must be taken into the account. Temperature compensation circuitry for combination selection based mismatch calibration is developed, designed and simulated. The new temperature compensated and mismatch calibrated current source achieves 99% accuracy in 4σ confidence over the temperature range of 30 degrees in centigrade. This range can still be extended by recalibrating the current source in intervals of 15 degrees in centigrade.
Starting Page	1589
Ending Page	1592
File Size	647737
Page Count	4
File Format	PDF
ISBN	9781424438273
DOI	10.1109/ISCAS.2009.5118074
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-05-24
Publisher Place	Taiwan
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Calibration Counting circuits Current measurement Temperature distribution Circuit optimization Information technology Microelectronics Laboratories Circuit simulation Signal processing
Content Type	Text
Resource Type	Article

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