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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Grayli, S.V. El-Chami, I. Bahreyni, B. Leach, G. |
| Copyright Year | 2015 |
| Description | Author affiliation: Mechatron. Syst. Eng., Simon Fraser Univ. Surrey, Surrey, BC, Canada (Grayli, S.V.; El-Chami, I.; Bahreyni, B.) || Dept. of Chem., Simon Fraser Univ., Burnaby, BC, Canada (Leach, G.) |
| Abstract | Uncooled infrared micro bolometer detectors have gained increasing attention for military and commercial imaging applications. Due to their light weight, low power, response in the infrared region, and compatibility with readout integrated circuits, traditional thermo-resistive vanadium oxide based micro-bolometers have become popular compared to pyro-electric and photo-detectors. Traditionally, VOx films are fabricated using ion beam or magnetron sputtering 1, 2. We report on using low cost dip coating deposition of an alkoxide sol gel precursor to fabricate uniform single and triple layers of vanadium oxide to a thickness of 150nm. Experimental results demonstrate the highest reported high temperature coefficient of resistance values for these films at -2.5%/°K, making the dip coating method a low cost alternative for the fabrication of IR sensing applications. |
| Sponsorship | IEEE |
| Starting Page | 1 |
| Ending Page | 4 |
| File Size | 811265 |
| Page Count | 4 |
| File Format | |
| e-ISBN | 9781479982035 |
| DOI | 10.1109/ICSENS.2015.7370601 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2015-11-01 |
| Publisher Place | South Korea |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Films Annealing Vanadium X-ray diffraction Temperature sensors Resistance Temperature measurement Vanadium Oxide Bolometer Photo-detectors Sol-Gel Process Uncooled Infra-Red Sensors |
| Content Type | Text |
| Resource Type | Article |
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