NDLI: Soft defects localization by signature magnification with selective windowing

Content Provider	IEEE Xplore Digital Library
Author	Sallem, S. Ravot, N.
Copyright Year	2015
Description	Author affiliation: LIST, CEA, Gif-sur-Yvette, France (Sallem, S.; Ravot, N.)
Abstract	The SMSW (Signature Magnification by Selective Windowing) method, based on a temporal processing treat the reflectogram so as to make soft defect signatures detectable. The algorithm first performs a localization of critical points of the reflectogram (zero-crossing or mean-crossing). Then, it selects points having enough energy in both sides (above threshold). This threshold is to be determined statistically or set depending on the application. Once the defect area is windowed, we proceed to the magnification procedure which amplify the defect signature while reducing the noise level on the reflectogram. The proposed method shows very convincing results both in simulation and experiments and for different types of cable and transmission line. We have demonstrated and assessed its applicability on coaxial cables, twisted pair and micro-strip lines. We found that we achieve a gain even with low SNR (Signal to Noise Ratio).
Sponsorship	IEEE
Starting Page	1
Ending Page	4
File Size	1311640
Page Count	4
File Format	PDF
e-ISBN	9781479982035
DOI	10.1109/ICSENS.2015.7370197
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-11-01
Publisher Place	South Korea
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Reflectometry Coaxial cables Power cables Impedance Time-domain analysis Monitoring Cable shielding selective amplification Soft defect detection time domain reflectometry cable diagnosis
Content Type	Text
Resource Type	Article

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