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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Ngai-Sze Lam Chi-Yung Lee Ming-Yeung Wan Dewen Tian Ming Li |
| Copyright Year | 2013 |
| Description | Author affiliation: ASM Technol. Hong Kong Ltd., Hong Kong, China (Ngai-Sze Lam; Chi-Yung Lee; Ming-Yeung Wan; Dewen Tian; Ming Li) |
| Abstract | Die attach process plays a key role in the thermal management of high power LED packages by governing the thermal resistance of the solder interfaces between the LED chips and the substrate materials. In this paper, comparison was made between the GaN based flip chip LED packages fabricated by (1) heated collet and (2) flux reflow eutectic die attach process. Thermal transient characteristics of the samples had been investigated based on the evaluation of the differential structure function and chip temperature measurement by infrared microscopy. It was shown that LEDs with higher void content would result in higher thermal resistance and chip temperature. Under high power operation at 6W, it was estimated that the junction temperature would exceed 80°C with void content 40%, which was at least 10°C higher comparing to that with void content 20%. Based on the result, LEDs samples bonded by heated collet die attach process had an average void content of 8.8% with 0.9% standard deviation, which were smaller comparing to the samples bonded by flux reflow die attach process (40% void content with standard deviation 20.5%). Due to the advantage of small void content control, it is possible to fabricate high power LED package with low thermal resistance, consistent and reliable die attach quality by using heated collet die attach process. |
| Sponsorship | IEEE Compon., Packag. Manuf. Technol. Soc. |
| Starting Page | 1197 |
| Ending Page | 1201 |
| File Size | 1648973 |
| Page Count | 5 |
| File Format | |
| ISBN | 9781479904983 |
| DOI | 10.1109/ICEPT.2013.6756673 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2013-08-11 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Light emitting diodes Thermal resistance Microassembly Heating Temperature measurement Junctions junction temperature flip chip light-emitting diode heated collet flux eutectic reflow void thermal resistance differential structure function |
| Content Type | Text |
| Resource Type | Article |
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