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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Junchao Wang Xiaosong Ma |
| Copyright Year | 2013 |
| Description | Author affiliation: Guilin Univ. of Electron. Technol., Guilin, China (Junchao Wang; Xiaosong Ma) |
| Abstract | In this paper, the method of accelerated degradation test is used in order to get the degradation of LED devices in a relatively short period of time, In the accelerated degradation test for selected LED samples, the number of stress level is 3, the sample volume is m = 18, and test the selected sample the luminous flux of each 48h. At first LED devices work 168 hours under 85°C, then the temperature is increased to 95°C, and after 168 hours' work, and then the temperature is raised to 105°C, the LED devices work under stress conditions higher than normal state, which quickly exposed product failure, effectively shorten the time sample failure required. When all the samples reach the specified failure criterion, the test ends. Establish the relationship between the average life expectancy of the LED samples and temperature according to the Arrhenius model. Combined with the Nelson rules, set up the statistical models of LED samples life under lognormal distribution. According to the reliability parameters, using MATLAB software to get LED samples' life curve and average life. |
| Sponsorship | IEEE Compon., Packag. Manuf. Technol. Soc. |
| Starting Page | 1162 |
| Ending Page | 1165 |
| File Size | 420112 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781479904983 |
| DOI | 10.1109/ICEPT.2013.6756665 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2013-08-11 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Light emitting diodes Degradation Life estimation Calibration Temperature distribution Stress Voltage measurement failure mechanismcomponent step-stress degradation LED devices |
| Content Type | Text |
| Resource Type | Article |
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