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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Songjun Pan Yu Hu Xiaowei Li |
| Copyright Year | 2010 |
| Description | Author affiliation: Key Laboratory of Computer System and Architecture, Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China, 100190 (Songjun Pan; Yu Hu; Xiaowei Li) |
| Abstract | With the advancement of CMOS manufacturing process to nano-scale, future shipped microprocessors will be increasingly vulnerable to intermittent faults. Quantitatively characterizing the vulnerability of microprocessor structures to intermittent faults at early design stage is significantly helpful to balance system performance and reliability. Prior researches have proposed several metrics to characterize the vulnerability of microprocessor structures to soft errors and permanent faults, however, the vulnerability of these structures to intermittent faults are still rarely considered. In this work, we propose a metric intermittent vulnerability factor (IVF) to characterize the vulnerability of microprocessor structures to intermittent faults. A structure's IVF is the probability an intermittent fault in that structure causes an external visible error. We instrument a cycle-accurate execution-driven simulator Sim-Alpha to compute IVFs for reorder buffer and register file. Experimental results show that the IVF of reorder buffer is much higher than that of register file. Besides, IVF varies significantly across different structures and workloads, which implies partial protection to the most vulnerable structures to improve system reliability with less overhead. |
| Starting Page | 238 |
| Ending Page | 243 |
| File Size | 253023 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781424470549 |
| ISSN | 15301591 |
| e-ISBN | 9783981080162 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-03-08 |
| Publisher Place | Germany |
| Access Restriction | Subscribed |
| Rights Holder | European Design Automation Association (EDAA) |
| Subject Keyword | In vitro fertilization Microprocessors Registers CMOS process Manufacturing processes System performance Instruments Computational modeling Protection Reliability |
| Content Type | Text |
| Resource Type | Article |
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