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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Ce Zhou Zhao Tao, J. Chun Zhao Werner, M. Taylor, S. Chalker, P.R. |
| Copyright Year | 2012 |
| Description | Author affiliation: Department of Microelectronics, Xi'an Jiaotong University, Xi'an 710016, China (Tao, J.) || Centre for Materials and Structures, School of Engineering, University of Liverpool, Liverpool L69 3GH, UK (Werner, M.; Chalker, P.R.) || Department of Electrical Engineering and Electronics, University of Liverpool, Liverpool L69 3GJ, UK (Taylor, S.) || Department of Electrical and Electronic Engineering, Xi'an Jiaotong-Liverpool University, Suzhou 215123, China (Ce Zhou Zhao; Chun Zhao) |
| Abstract | Frequency dispersion in lanthanide-based ternary oxides is often observed in capacitance-voltage (C-V) measurements. The frequency dependence of the dielectric constant (k-value), that is the intrinsic frequency dispersion (dielectric relaxation), could not be assessed before suppressing the effects of extrinsic frequency dispersion, such as the effects of the lossy interfacial layer (between the lanthanide-based ternary oxide and silicon substrate) and the parasitic effects. After taking extrinsic frequency dispersion into account, the relaxation behavior can be modeled using the Havriliak-Negami (HN) relationship. Dielectric relaxation mechanisms are also discussed. |
| Starting Page | 1 |
| Ending Page | 4 |
| File Size | 570588 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781467324748 |
| e-ISBN | 9781467324755 |
| DOI | 10.1109/ICSICT.2012.6467814 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2012-10-29 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Dielectrics Mathematical model Equations Frequency measurement High K dielectric materials Dispersion Capacitance-voltage characteristics |
| Content Type | Text |
| Resource Type | Article |
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