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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Ming Liu Hang-Bing Lv Qi Liu Ying-Tao Li Ling Li Shi-Bing Long Hai-Tao Sun Xiao-Yi Yang Ming Wang Hong-Wei Xie Xiao-Yu Liu |
| Copyright Year | 2012 |
| Description | Author affiliation: Laboratory of Nano-Fabrication and Novel Devices Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China (Ming Liu; Hang-Bing Lv; Qi Liu; Ying-Tao Li; Ling Li; Shi-Bing Long; Hai-Tao Sun; Xiao-Yi Yang; Ming Wang; Hong-Wei Xie; Xiao-Yu Liu) |
| Abstract | Electrochemical metallization theory is widely adopted to interpret the process of conductive filaments (CF) formation and rupture in electrolyte based resistive switching memory. However, this theory generally suit the situation of fast ionic mobility. For material system with low ionic mobility, there exist some controversies with the conventional electrochemical metallization theory. In this work, we performed real-time characterization of resistive switching in binary oxide electrolyte based RRAM. We found the CF was grown from the anode instead of the cathode. Thus, modified microscopic mechanism based on the local redox reaction inside the ZrO-electrolyte system was suggested to account for observed RS effect. |
| Starting Page | 1 |
| Ending Page | 4 |
| File Size | 298098 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781467324748 |
| e-ISBN | 9781467324755 |
| DOI | 10.1109/ICSICT.2012.6467647 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2012-10-29 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Cathodes Anodes Films Ions Probes |
| Content Type | Text |
| Resource Type | Article |
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