NDLI: An optical comparison of silicone and EVA encapsulants for conventional silicon PV modules: A ray-tracing study

Content Provider	IEEE Xplore Digital Library
Author	McIntosh, K.R. Cotsell, J.N. Cumpston, J.S. Norris, A.W. Powell, N.E. Ketola, B.M.
Copyright Year	2009
Description	Author affiliation: Dow Corning Corporation, Midland, Michigan 48686, USA (Norris, A.W.; Powell, N.E.; Ketola, B.M.) \|\| Centre for Sustainable Energy Systems, Australian National University, Canberra, ACT 0200, AUSTRALIA (McIntosh, K.R.; Cotsell, J.N.; Cumpston, J.S.)
Abstract	Ray-trace simulation is used to quantify the optical losses of photovoltaic modules containing silicon cells. The simulations show that when the module's encapsulant is silicone rather than ethylene vinyl acetate (EVA), the module's short-circuit current density under the AM1-5g spectrum is 0.7–1.1% higher for screen-printed multi-cSi cells, 0.5–1.2% higher for screen-printed mono-cSi cells, and 1.0–1.6% higher for high-efficiency rear-contact cells, depending on the type of silicone. This increase is primarily due to the transmission of short-wavelength light (≪420 nm) and is therefore greatest when used with low UV-absorbing glass and cells of a high IQE at short wavelength. We also quantify absorption in the glass, EVA and silicone at longer wavelengths and describe the influence of an encapsulant's refractive index on escape losses.
Starting Page	000544
Ending Page	000549
File Size	8131140
Page Count	6
File Format	PDF
ISBN	9781424429493
ISSN	01608371
DOI	10.1109/PVSC.2009.5411624
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-06-07
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Silicon Ray tracing Optical refraction Optical variables control Glass Optical losses Photovoltaic systems Solar power generation Current density Absorption
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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