NDLI: Importance of optical confinement in organic thin film solar cells

Content Provider	IEEE Xplore Digital Library
Author	Muramatsu, S.-I. Miyauchi, H.
Copyright Year	2009
Description	Author affiliation: Department of Environmental and Systems Engineering, Faculty of Science and Engineering, Tokushima Bunri University, Shido, Sanuki City, Kagawa 769-2193, Japan (Muramatsu, S.-I.; Miyauchi, H.)
Abstract	We have found that the short-circuit current, J, of polymer/fullerene [RR-P3HT/C] solar cells has a clear dependence on the surface roughness of the ITO∣glass substrate after the post-metallization annealing. We prepared an ITO surface with an average roughness, R, of 1 – 9 nm by chemical etching. When solar cell structures were made on these ITO surfaces, the diffuse reflection intensity increases with the increase in ITO surface roughness. Also, the solar cell performance, J increases drastically with ITO roughness after annealing. This feature suggests that the diffuse reflection of Al\|P3HT/C interface is quite important for optical confinement of the cells, after post-metallization annealing. The effect is quite effective to improve cell performances.
Starting Page	002412
Ending Page	002415
File Size	8041526
Page Count	4
File Format	PDF
ISBN	9781424429493
ISSN	01608371
DOI	10.1109/PVSC.2009.5411298
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-06-07
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Optical films Photovoltaic cells Rough surfaces Surface roughness Indium tin oxide Annealing Optical reflection Optical polymers Polymer films Substrates
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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