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Content Provider | IEEE Xplore Digital Library |
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Author | Stoke, J.A. Dahal, L.R. Jian Li, Podraza, N.J. Xinmin Cao, Deng, X. Collins, R.W. |
Copyright Year | 2008 |
Description | Author affiliation: Center for Photovoltaics Innovation and Commercialization, University of Toledo, OH 43606, USA (Stoke, J.A.; Dahal, L.R.; Jian Li,; Podraza, N.J.; Xinmin Cao,; Deng, X.; Collins, R.W.) |
Abstract | Phase diagrams have been developed to guide very high frequency (vhf) plasma-enhanced chemical vapor deposition (PECVD) of intrinsic hydrogenated amorphous silicon (a-Si:H), amorphous silicon-germanium alloys (a-Si:H), and nanocrystalline silicon (nc-Si:H) for use as the top, middle, and bottom cell i-layer components, respectively, of triple junction n-i-p solar cells. These phase diagrams have been used in conjunction with cross-sectional transmission electron microscopy (XTEM) to identify nucleation and growth behavior in order to gain a better understanding of phase evolution. The substrates for phase diagram development by real time spectroscopic ellipsometry (RTSE) are crystalline Si wafers that have been over-deposited with either n-type a-Si:H for the top and middle cell amorphous i-layers, or n-type nc-Si:H for the bottom cell nanocrystalline i-layer. Identical n/i cell structures were co-deposited on textured (stainless steel)/Ag/ZnO, which serve as substrate/back-reflectors, in order to relate the RTSE-developed phase diagrams to the performance parameters of single-junction solar cells. This study has reaffirmed that the highest efficiencies for a-Si:H and a-Si:H solar cells are obtained when the i-layers are prepared under previously-described maximal H dilution conditions. The phase diagram for the bottom cell using a nc-Si:H n-layer reveals for the first time a bifurcation at a critical R value between mixed-toamorphous phase transitions [(a+nc) → a] at low R and mixed-to-single phase nanocrystalline transitions at high R [(a+nc) → nc]. The highest efficiency single-step nc-Si:H solar cell is obtained at minimal R while remaining on the nanocrystalline side of the identified bifurcation where suitable grain boundary passivation is assured. |
Starting Page | 1 |
Ending Page | 6 |
File Size | 4470002 |
Page Count | 6 |
File Format | |
ISBN | 9781424416400 |
ISSN | 01608371 |
DOI | 10.1109/PVSC.2008.4922762 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2008-05-11 |
Publisher Place | USA |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Photovoltaic cells Amorphous materials Bifurcation Frequency Plasma chemistry Chemical vapor deposition Amorphous silicon Germanium silicon alloys Silicon germanium Germanium alloys |
Content Type | Text |
Resource Type | Article |
Subject | Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering |
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