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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Koval, R.J. Pearce, J.M. Ferlauto, A.S. Collins, R.W. Wronski, C.R. |
| Copyright Year | 2000 |
| Description | Author affiliation: Centre for Thin Film Devices, Pennsylvania State Univ., University Park, PA, USA (Koval, R.J.) |
| Abstract | A systematic study has been carried out to quantify the effect of microcrystallite nucleation in the intrinsic layer of protocrystalline Si:H p-i-n solar cells prepared by rf plasma enhanced chemical vapor deposition (PECVD). Real-time spectroscopic ellipsometry (RTSE) results that have previously identified the transitions from amorphous to microcrystalline phase were confirmed with atomic force microscopy (AFM) images. The effects of the phase transitions in the bulk intrinsic layer, as well as near the p/i interface of p-i-n cells, have been evaluated as a function of film thickness and H/sub 2/-dilution ratio (R=[H/sub 2/]/[SiH/sub 4/]). Illuminated and dark J-V characteristics are correlated with the microstructural evolution of the Si:H films yielding insight into the "sharpness" of the transition. Evidence of abrupt changes in the mobility gap is obtained from the selfconsistent numerical modeling of cell characteristics. |
| Starting Page | 750 |
| Ending Page | 753 |
| File Size | 400293 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780357728 |
| ISSN | 01608371 |
| DOI | 10.1109/PVSC.2000.915992 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2000-09-15 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Amorphous materials PIN photodiodes Atomic force microscopy Photovoltaic cells Plasma chemistry Chemical vapor deposition Spectroscopy Ellipsometry Radiofrequency identification Atomic layer deposition |
| Content Type | Text |
| Resource Type | Article |
| Subject | Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering |
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