NDLI: The effect of cell thickness on module reliability

Content Provider	IEEE Xplore Digital Library
Author	Wohlgemuth, John H. Cunningham, Daniel W. Placer, Neil V. Kelly, George J. Nguyen, Andy M.
Copyright Year	2008
Description	Author affiliation: BP Solar International, Frederick, MD 21703 USA (Wohlgemuth, John H.; Cunningham, Daniel W.; Placer, Neil V.; Kelly, George J.; Nguyen, Andy M.)
Abstract	This paper addresses the issue of the reliability of modules using ultra-thin crystalline silicon cells. Do thin cells have a greater likelihood of cracking during production, transport, installation or use and if so does this result in long term degradation of the power? The present qualification test sequence, IEC 61215 does not adequately address this issue, The only mechanical test in IEC 61215 is a static mechanical load test consisting of three load cycles that are performed after the accelerated stress tests. So even if this mechanical load test does break cells, it is unlikely to result in significant power loss. BP Solar has developed a test sequence for evaluation of cracked cells in PV modules. The test sequence incorporates a dynamic mechanical load test performed before the 50 thermal cycles/10 humidity freeze cycles of IEC 61215. Usually there is no significant power loss after the dynamic load testing. However, the subsequent thermal cycling opens up the cracks that propagated during the dynamic load test resulting in significant power loss. Having a test sequence that identifies damaged cells allows us to develop processes and handling procedures to minimize or eliminate damage to the ultra-thin cells, resulting in reliable modules.
Starting Page	1
Ending Page	4
File Size	6244215
Page Count	4
File Format	PDF
ISBN	9781424416400
ISSN	01608371
DOI	10.1109/PVSC.2008.4922770
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-05-11
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Testing IEC standards Performance evaluation Thermal loading Crystallization Silicon Production Degradation Qualifications Life estimation
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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