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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Holst, S. Wunderlich, H.-J. |
| Copyright Year | 2009 |
| Description | Author affiliation: Institut für Technische Informatik, Universität Stuttgart, Pfaffenwaldring 47; D-70569, Germany (Holst, S.; Wunderlich, H.-J.) |
| Abstract | During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including built-in self-test (BIST) and multi-site testing are quite effective cost reduction techniques which may make diagnosis more complex. This paper presents a test response compaction scheme and a corresponding diagnosis algorithm which are especially suited for BIST and multi-site testing. The experimental results on industrial designs show, that test time and response data volume reduces significantly and the diagnostic resolution even improves with this scheme. A comparison with X-Compact indicates, that simple parity information provides higher diagnostic resolution per response data bit than more complex signatures. |
| Starting Page | 1355 |
| Ending Page | 1360 |
| File Size | 433656 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781424437818 |
| ISSN | 15301591 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-04-20 |
| Publisher Place | France |
| Access Restriction | Subscribed |
| Rights Holder | European Design Automation Association (EDAA) |
| Subject Keyword | Compaction Automatic testing Built-in self-test Logic testing Costs Bandwidth Fault diagnosis Automatic test equipment Time factors Design for testability Design-for-test Diagnosis Embedded diagnosis Multi-site test |
| Content Type | Text |
| Resource Type | Article |
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