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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Jinjun Xiong Zolotov, V. Venkateswaran, N. Visweswariah, C. |
| Copyright Year | 2006 |
| Description | Author affiliation: California Univ., Los Angeles, CA (Jinjun Xiong) |
| Abstract | Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult since different paths are frequency-limiting in different parts of the multi-dimensional process space. Therefore, it is desirable to have a new diagnostic metric for robust circuit optimization. This paper presents a novel algorithm to compute the criticality probability of every edge in the timing graph of a design with linear complexity in the circuit size. Using industrial benchmarks, we verify the correctness of our criticality computation via Monte Carlo simulation. We also show that for large industrial designs with 442,000 gates, our algorithm computes all edge criticalities in less than 160 seconds |
| Sponsorship | SiCda EDA Consortium IEEE Circuits & Syst. Soc. IEEE CASS/CANDE CANDE CEDA |
| Starting Page | 63 |
| Ending Page | 68 |
| File Size | 1394776 |
| Page Count | 6 |
| File Format | |
| ISBN | 1595933816 |
| ISSN | 0738100X |
| DOI | 10.1109/DAC.2006.229166 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2006-07-24 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Association for Computing Machinery, Inc. (ACM) |
| Subject Keyword | Timing Delay Probability Manufacturing processes Design optimization Constraint optimization Circuit analysis computing Algorithm design and analysis Computer aided manufacturing Circuit testing Parametric variation Algorithms Verification Criticality probability Statistical timing |
| Content Type | Text |
| Resource Type | Article |
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