NDLI: Unknown-tolerance analysis and test-quality control for test response compaction using space compactors

Content Provider	IEEE Xplore Digital Library
Author	Chao, M.C.-T. Kwang-Ting Cheng Seongmoon Wang Chakradhar, S. Wen-Long Wei
Copyright Year	2006
Description	Author affiliation: Dept. of ECE, UC, Santa Barbara, CA (Chao, M.C.-T.; Kwang-Ting Cheng)
Abstract	For a space compactor, degradation of fault detection capability caused by the masking effects from unknown values is much more serious than that caused by error masking (i.e. aliasing). In this paper, we first propose a mathematical framework to estimate the percentage of observable responses under unknown-induced masking for a space compactor. We further develop a prediction scheme which can correlate the percentage of observable responses with the modeled-fault coverage and with an n-detection metric for a given test set. As a result, the quality of a space compactor can be measured directly based on its test quality, instead of based on indirect metrics such as the number of tolerated unknowns or the aliasing probability. With the prediction scheme above, we propose a construction flow for space compactors to achieve the desired level of test quality while maximizing the compaction ratio
Sponsorship	SiCda EDA Consortium IEEE Circuits & Syst. Soc. IEEE CASS/CANDE CANDE CEDA
Starting Page	1083
Ending Page	1088
File Size	2225165
Page Count	6
File Format	PDF
ISBN	1595933816
ISSN	0738100X
DOI	10.1109/DAC.2006.229401
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-07-24
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Association for Computing Machinery, Inc. (ACM)
Subject Keyword	Compaction Circuit faults Convolutional codes Circuit testing Fault detection Degradation Extraterrestrial measurements Chaos National electric code Automatic test pattern generation design for test Design Test response compaction
Content Type	Text
Resource Type	Article

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