NDLI: A fast passivity test for descriptor systems via structure-preserving transformations of skew-Hamiltonian/Hamiltonian matrix pencils

Content Provider	IEEE Xplore Digital Library
Author	Wong, N. Chu, C.K.
Copyright Year	2006
Description	Author affiliation: Dept. of Electr. & Electron. Engg., Hong Kong Univ., Kowloon (Wong, N.; Chu, C.K.)
Abstract	Passivity in a VLSI model is an important property to guarantee stable global simulation. Most VLSI models are naturally described as descriptor systems (DSs) or singular state spaces. Passivity tests for DSs, however, are much less developed compared to their non-singular state space counterparts. For large-scale DSs, the existing test based on linear matrix inequality (LMI) is computationally prohibitive. Other system decoupling techniques involve complicated coding and sometimes ill-conditioned transformations. This paper proposes a simple DS passivity test based on the key insight that the sum of a passive system and its adjoint must be impulse-free. A sidetrack shows that the proper (non-impulsive) part of a passive DS can be easily decoupled along the test flow. Numerical examples confirm the effectiveness of the proposed DS passivity test over conventional approaches
Sponsorship	SiCda EDA Consortium IEEE Circuits & Syst. Soc. IEEE CASS/CANDE CANDE CEDA
Starting Page	261
Ending Page	266
File Size	1195430
Page Count	6
File Format	PDF
ISBN	1595933816
ISSN	0738100X
DOI	10.1109/DAC.2006.229221
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-07-24
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Association for Computing Machinery, Inc. (ACM)
Subject Keyword	System testing Decision support systems Very large scale integration State-space methods Linear matrix inequalities Riccati equations Impulse testing Permission Large-scale systems Computational modeling passivity test Algorithms Descriptor system positive real
Content Type	Text
Resource Type	Article

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