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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Su, J.H. Sastry, P.V.P.S.S. Schwartz, J. |
| Copyright Year | 2002 |
| Abstract | (Hg,Re)Ba/sub 2/CaCu/sub 2/O/sub y/ thin films have been fabricated on [100] LaAlO/sub 3/ by reacting laser deposited Re/sub 0.2/Ba/sub 2/CaCu/sub 2/O/sub y/ precursor films with CaHgO/sub 2/ in sealed quartz tubes at 780/spl deg/C for times ranging between 0 h -16 h. The films reacted for more than 2 h exhibit high phase purity (Hg,Re)-1212 and good c-axis texture. Scanning electron microscopy and x-ray diffraction studies showed the existence of small amounts of a-axis oriented grains in all the reacted films. The root-mean-square roughness, measured by atomic force microscopy (AFM), increases initially with increase in heat treatment duration and saturates at /spl sim/300 nm after 4 h. The evolution of the surface roughness can be partially explained with a high nucleation density and the appearance of a three-dimensional structure during the initial stages of film growth and crystal coalescence at further growth. Two-dimensional planar growth with a one-unit-cell growth unit in the c direction was observed by AFM. |
| Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
| Starting Page | 2809 |
| Ending Page | 2812 |
| Page Count | 4 |
| File Size | 520637 |
| File Format | |
| ISSN | 10518223 |
| Volume Number | 13 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2003-06-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Surface morphology Atomic force microscopy Atomic measurements Force measurement Sputtering Scanning electron microscopy X-ray diffraction Heat treatment Rough surfaces Surface roughness |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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