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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Vitusevich, S.A. Klein, N. Zaitsev, A.G. Geerk, J. |
| Copyright Year | 2002 |
| Abstract | Nonlinear properties of high-temperature superconducting (HTS) strongly coupled resonators at different input power have been investigated by measurements of the quality factor as a function of input power as well as by generation of the intermodulation distortion (IMD). The double-sided YBCO films on CeO/sub 2/ buffered sapphire demonstrate advanced performance with the microwave surface resistance of /spl sim/0.3 m/spl Omega/ at 8.5 GHz at 77 K and an IMD third-order interception point estimated at P/sub circ//spl ap/70 W. A parallel feedback oscillator was assembled using a transmission type HTS resonator cooled with liquid nitrogen and a room temperature low noise amplifier. Results on the phase noise investigation of the 2.3 GHz oscillator based on HTS resonator operated in the nonlinear regime demonstrated a deviation from the simple model of the phase noise, which predicts an up-conversion of 1/f noise of the amplifier to oscillator phase noise. The latter can be explained by the phase noise introduced additionally due to the nonlinear response of the HTS resonator. |
| Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
| Starting Page | 324 |
| Ending Page | 327 |
| Page Count | 4 |
| File Size | 521312 |
| File Format | |
| ISSN | 10518223 |
| Volume Number | 13 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2003-06-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Phase noise High temperature superconductors Superconducting device noise Superconducting films Surface resistance Oscillators Superconducting microwave devices Couplings Distortion measurement Electrical resistance measurement |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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