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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Schneidewind, H. Stelzner, T. |
| Copyright Year | 2002 |
| Abstract | We prepared double-sided Tl/sub 2/Ba/sub 2/CaCu/sub 2/O/sub 8/ (Tl-2212) thin films on large area sapphire substrates (up to 3 inch) for high frequency filters, which are intended to be used in future communication systems. For high frequency operation one demands film thicknesses three or four times the penetration depth /spl lambda/, but the thin film preparation process has several limits for the film thickness. Beside the crack formation on sapphire substrates due to different thermal expansion coefficients the surface morphology with parameters as roughness or the formation of precipitates depend on the film thickness. We show results of an optimization process to achieve the best suitability of the films for high frequency devices. The investigations were done in terms of SEM and AFM surface inspections as well as the measurement of electrical film parameters as critical temperature T/sub c/, critical current density J/sub c/, or surface resistance R/sub s/. |
| Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
| Starting Page | 2762 |
| Ending Page | 2765 |
| Page Count | 4 |
| File Size | 497437 |
| File Format | |
| ISSN | 10518223 |
| Volume Number | 13 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2003-06-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Surface morphology Thin film devices Frequency Surface resistance Transistors Substrates Rough surfaces Surface roughness Filters Thermal expansion |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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