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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Horvat, J. Soltanian, S. Wang, X.L. Dou, S.X. |
| Copyright Year | 2002 |
| Abstract | Transport critical current (I/sub c/) was measured for MgB/sub 2//Fe round wires, with the magnetic field oriented perpendicular to the wire and parallel to it. Measurements were made on a wire with a pure MgB/sub 2/ core and another wire where the MgB/sub 2/ core was doped with nano-size SiC. This doping strongly improved the vortex pinning in MgB/sub 2/. The field dependence of I/sub c/ was strongly improved due to the presence of the iron sheath. At 30 K, I/sub c/ did not depend on the field for fields between 0.09 and 0.7 T. At lower temperatures, I/sub c/ increased with the field, after an initial decrease, resembling a "peak effect." This effect was extended to higher fields as the temperature was decreased: at 10 K the peak appeared at 3.5 T. This improvement was not due to mere magnetic shielding by iron, but more likely to an interaction between the iron sheath and the superconductor. Improvement of vortex pinning did not affect the range of fields within which this effect was observed. J/sub c/ of SiC doped MgB/sub 2//Fe wires at elevated fields already satisfies the requirements for their use in production of superconducting magnets for particle accelerators. |
| Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
| Starting Page | 3324 |
| Ending Page | 3327 |
| Page Count | 4 |
| File Size | 250293 |
| File Format | |
| ISSN | 10518223 |
| Volume Number | 13 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2003-06-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Magnetic shielding Iron Magnetic field measurement Wire Magnetic cores Silicon carbide Superconducting magnets Critical current Current measurement Doping |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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