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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Wozniak, U. Linker, G. Geerk, J. |
| Copyright Year | 2002 |
| Abstract | The growth of Ce-Y-Zr-O (CYZ) buffer layers for YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// deposition on textured Ni-tapes was studied under idealized conditions on [100]-SrTiO/sub 3/ (STO) single crystals and epitaxial Ni films and under real conditions on textured NiCr-tapes. The metallic substrates were epitaxially surface oxidized prior to deposition. The subsequent CYZ-layer was produced by rf sputtering employing combined planar and cylindrical targets and was characterized by x-ray diffraction (XRD) and Rutherford Backscattering. Films sputtered on STO-single crystals were 100 nm thick, had lattice constants between 0.5191 and 0.5443 nm, and out-of-plane mosaic spreads between 0.6 and 3.2/spl deg/. Best films grown on epitaxially surface oxidized Ni films and NiCr-tapes had lattice constants of 0.5220 and 0.5226 nm, and out-of-plane mosaic spreads of 2.3/spl deg/ and 6.8/spl deg/, respectively and were highly [100]-orientated (> 95%). |
| Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
| Starting Page | 2547 |
| Ending Page | 2550 |
| Page Count | 4 |
| File Size | 274222 |
| File Format | |
| ISSN | 10518223 |
| Volume Number | 13 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2003-06-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Sputtering Substrates Crystals Lattices Oxidation Epitaxial growth Temperature distribution Atmosphere Argon Buffer layers |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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