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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Saito, A. Ishida, H. Irie, A. Kawakami, A. Zhen Wang Oya, G. Hamasaki, K. |
| Copyright Year | 2002 |
| Abstract | We have measured the temperature dependence of the low-frequency noise properties across for mesa stacks of intrinsic Josephson junctions (IJJs) in single crystals of Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub y/ (BSCCO) in the absence of an external magnetic field. The measured curves for noise spectrum density S/sub V/(f) showed a 1/f frequency dependence at temperatures in the range from 4.3 K to 150 K except 36 K. We estimated the magnitude of the S/sub V/(f) by using Rogers and Buhrman's empirical theory and Machlup's formula. From the observed curves for S/sub V/(f), we estimated a 1/f noise level /spl eta/ for a BSCCO IJJ biased at a sub-gap voltage of approximately 10/sup -5/ /spl mu/m/sup 2/, and this value was almost completely independent of temperature in the range between 4.3 K and 40 K. We also found that the /spl eta/ values above T/sub c/ were smaller by a factor of approximately 10 than those below T/sub c/. The /spl eta/ value for the BSCCO IJJ is approximately two orders of magnitude greater than for an epitaxial NbN/MgO/NbN tunnel junction biased above-gap voltage. We consider that the observed variation in the noise level with temperature is not interpretable in terms of a magnetic origin and the 1/f noise in a BSCCO IJJ may be somehow associated with stress or defects in the BiO and/or SrO layers act as tunnel barriers. |
| Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
| Starting Page | 904 |
| Ending Page | 907 |
| Page Count | 4 |
| File Size | 557242 |
| File Format | |
| ISSN | 10518223 |
| Volume Number | 13 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2003-06-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Temperature dependence Low-frequency noise Bismuth compounds Noise level Time of arrival estimation Noise measurement Magnetic field measurement Magnetic noise Temperature distribution Voltage |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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