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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Huish, D.W. Velichko, A.V. Lancaster, M.J. Abell, J.S. Xuming Xiong Almond, D.P. Hyland, D. Perry, A. Porch, A. |
| Copyright Year | 2002 |
| Abstract | Planar HTS microwave devices require high quality, homogeneous samples. In this paper, sensitive measurements of the microwave surface impedance of YBCO thin films using coplanar resonators are collated with modulated optical reflectance (MOR) measurements. MOR provides a powerful noncontact, nondestructive and high resolution means of probing local variations in the quality of thin films at room temperature, and consequently has great potential for diagnostic testing of HTS films prior to microwave device patterning. Microwave and MOR inter-comparisons of four YBCO films patterned into 5.2 and 8 GHz coplanar resonators are presented. Superior global microwave response in the superconducting state, such as low surface impedance and low levels of nonlinearity at enhanced powers, correlate with the magnitude and spatial homogeneity of the room temperature MOR signals. The presence of defects in films is investigated using both techniques. Both large scale single defects and film inhomogeneity can be detected using MOR; however, the spatial resolution of the technique is not sufficient to detect single weak links on a sub-micron scale, whose presence can result in severely degraded microwave resonator performance. |
| Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
| Starting Page | 3638 |
| Ending Page | 3642 |
| Page Count | 5 |
| File Size | 445054 |
| File Format | |
| ISSN | 10518223 |
| Volume Number | 13 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2003-06-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Optical modulation Optical films Reflectivity Yttrium barium copper oxide Superconducting microwave devices Optical resonators Superconducting films Optical sensors High temperature superconductors Impedance measurement |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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