NDLI: Low jitter FBAR based chip scale precision oscillator

Content Provider	IEEE Xplore Digital Library
Author	Sridaran, S. Fouquet, J. Parker, R. Small, M. Ortiz, S. Bi, F. Gilbert, S.R. Callaghan, L. Ruby, R.
Copyright Year	2014
Description	Author affiliation: Wireless Semicond. Div., Avago Technol., San Jose, CA, USA (Sridaran, S.; Fouquet, J.; Parker, R.; Small, M.; Ortiz, S.; Bi, F.; Gilbert, S.R.; Callaghan, L.; Ruby, R.)
Abstract	We present a FBAR oscillator that operates at 628MHz, achieves low jitter <;50fs and good frequency stability all while fitting in a small package of 1.1 × 0.9 × 0.25 $mm^{3}.$ The chip-scale oscillator employs a feedback circuitry in the encapsulating lid of a FBAR resonator and makes use of a differential Colpitts oscillator design fabricated in 0.6μm CMOS technology. To achieve the frequency precision required for a reference oscillator, we demonstrate the ability to tune the oscillator over 700ppm using a switched capacitor scheme to compensate for manufacturing tolerances. For achieving frequency stability over temperature and packaging stress, the FBAR resonators used in these oscillators employ silicon dioxide layer temperature compensation and a stress relieved structure respectively. The measured integrated jitter (12kHz to 20MHz) for the oscillators with a supply voltage of 3.3V across a wafer is 33fs with a far from carrier phase noise of -170dBc/Hz .The median current draw from the supply is 16.5mA and the output power measured at a 50ohm load using a balun is 0dBm.These oscillators are suitable for co-integration as reference clocks in high speed communication ICs where size and performance are paramount.
Starting Page	85
Ending Page	88
File Size	1321869
Page Count	4
File Format	PDF
e-ISBN	9781479970490
DOI	10.1109/ULTSYM.2014.0022
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2014-09-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Resonant frequency Film bulk acoustic resonators Temperature measurement Jitter Stress Phase noise high Q resonator FBAR BAW frequency reference chip-scale packaged oscillator zero drift resonator
Content Type	Text
Resource Type	Article

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