NDLI: Statistical Breakdown Measurement Technique for Monitoring Diode-Switch Reliability in Active Matrix LCD Production

Content Provider	IEEE Xplore Digital Library
Author	Bijlsma, S.J. van Kranenburg, H. Nieuwesteeg, K.J.B.M. Pitt, M.G. Verweij, J.F.
Copyright Year	1995
Description	Author affiliation: MESA research institute, University of Twente, P.O box 217, 7500 AE Enschede, The Netherlands (Bijlsma, S.J.; van Kranenburg, H.; Verweij, J.F.) \|\| Flat Panel Display Co. (FPD) B.V., Prof. Holstlaan 4, 5656 AA Eindhoven, The Netherlands (Nieuwesteeg, K.J.B.M.; Pitt, M.G.)
Abstract	An important aspect in the production of high quality active matrix addressed liquid crystal displays (AMILCDs) is the operational reliability of the electrical switching devices in the active matrix. Failing pixels in the display may occur if the switches on the glass substrate are subject to electrical breakdown. In this study, a measurement method is presented that uses forced electrical breakdown on many samples $(10^{3}-10^{4})$ of thin film diodes (TFDs), that are used as switches in TFD-R displays. The method allows us to obtain information on extrinsic defect densities and failure modes related to the production process, as well as the limits of electrical reliability of the switches.
Starting Page	331
Ending Page	334
File Size	331087
Page Count	4
File Format	PDF
ISBN	286332182X
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1995-09-25
Publisher Place	The Netherlands
Access Restriction	Subscribed
Rights Holder	Editions Frontieres
Subject Keyword	Electric breakdown Measurement techniques Active matrix organic light emitting diodes Active matrix liquid crystal displays Production Active matrix addressing Liquid crystal displays Switches Condition monitoring Glass
Content Type	Text
Resource Type	Article

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