NDLI: Small-delay-fault ATPG with waveform accuracy

Content Provider	IEEE Xplore Digital Library
Author	Sauer, M. Czutro, A. Polian, I. Becker, B.
Copyright Year	2012
Description	Author affiliation: Albert-Ludwigs-University Freiburg, Georges-Köhler-Allee 051, 79110 Freiburg, Germany (Sauer, M.; Czutro, A.; Becker, B.) \|\| University of Passau, Innstraße 43, 94032 Passau, Germany (Polian, I.)
Abstract	The detection of small-delay faults is traditionally performed by sensitizing transitions on a path of sufficient length from an input to an output of the circuit going through the fault site. While this approach allows efficient test generation algorithms, it may result in false positives and false negatives as well, i.e. undetected faults are classified as detected or detectable faults are classified as undetectable. We present an automatic test pattern generation algorithm which considers waveforms and their propagation on each relevant line of the circuit. The model incorporates individual delays for each gate and filtering of small glitches. The algorithm is based on an optimized encoding of the test generation problem by a Boolean satisfiability (SAT) instance and is implemented in the tool WaveSAT. Experimental results for ISCAS-85, ITC-99 and industrial circuits show that no known definition of path sensitization can eliminate false positives and false negatives at the same time, thus resulting in inadequate small-delay fault detection. WaveSAT generates a test if the fault is testable and is also capable of automatically generating a formal redundancy proof for undetectable small-delay faults; to the best of our knowledge this is the first such algorithm that is both scalable and complete.
Starting Page	30
Ending Page	36
File Size	462522
Page Count	7
File Format	PDF
ISBN	9781450315739
ISSN	10923152
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-11-05
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Association for Computing Machinery, Inc. (ACM)
Subject Keyword	Circuit faults Logic gates Automatic test pattern generation Delay Integrated circuit modeling Robustness
Content Type	Text
Resource Type	Article
Subject	Computer Graphics and Computer-Aided Design Computer Science Applications Software

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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