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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Zhao, Jia Lu, Shiting Burleson, Wayne Tessier, Russell |
| Copyright Year | 2013 |
| Description | Author affiliation: Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, USA 01003-9284 (Zhao, Jia; Lu, Shiting; Burleson, Wayne; Tessier, Russell) |
| Abstract | Many-core architectures use large numbers of small temperature sensors to detect thermal gradients and guide thermal management schemes. In this paper a technique to identify thermal sensors which are operating outside a required accuracy is described. Unlike previous on-chip temperature estimation approaches, our algorithms are optimized to run on-line while thermal management decisions are being made. The accuracy of a sensor is determined by comparing its readings to expected values from a probability distribution function determined from surrounding sensors. Experiments show that a sensor operating outside a desired accuracy can be identified with a detection rate of over 90% and an average false alarm rate of < 6%, with a confidence level of 90%. The run time of our method is shown to be around 3× lower than a recently-published temperature estimation method, enhancing its suitability for run-time implementation. |
| Starting Page | 1395 |
| Ending Page | 1398 |
| File Size | 115552 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781467350716 |
| ISSN | 15301591 |
| e-ISBN | 9783981537000 |
| DOI | 10.7873/DATE.2013.285 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2013-03-18 |
| Publisher Place | France |
| Access Restriction | Subscribed |
| Rights Holder | European Design Automation Association (EDAA) |
| Subject Keyword | Temperature sensors Temperature measurement Temperature distribution Probability distribution System-on-chip |
| Content Type | Text |
| Resource Type | Article |
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