NDLI: On candidate fault sets for fault diagnosis and dominance graphs of equivalence classes

Content Provider	IEEE Xplore Digital Library
Author	Pomeranz, Irith
Copyright Year	2013
Description	Author affiliation: School of Electrical & Computer Eng., Purdue University, W. Lafayette, IN 47907, U.S.A. (Pomeranz, Irith)
Abstract	The goal of fault diagnosis is to identify a set of candidate faults, or fault locations, that explain an observed faulty output response of a chip. In fault diagnosis procedures that are based on specific fault models, a scoring algorithm can be used for defining sets of candidate faults that include the faults with the highest scores. This paper shows that it is possible to capture the underlying concepts that make fault scoring effective through a graph, which is referred to as the dominance graph. With a test set T used for fault diagnosis, the graph represents the dominance relations between the equivalence classes obtained with respect to T. The observed response Robs of a chip-under-diagnosis is associated with an equivalence class Cobs, and Cobs is added to the dominance graph. A candidate fault set is defined based on the dominance relations that are added to the graph due to the addition of Cobs. Certain properties of these dominance relations point to the type of the defect present in the chip, and the most appropriate algorithm for defining a set of candidate faults based on it.
Starting Page	1083
Ending Page	1088
File Size	472952
Page Count	6
File Format	PDF
ISBN	9781467350716
ISSN	15301591
e-ISBN	9783981537000
DOI	10.7873/DATE.2013.228
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-03-18
Publisher Place	France
Access Restriction	Subscribed
Rights Holder	European Design Automation Association (EDAA)
Subject Keyword	Circuit faults Computational modeling
Content Type	Text
Resource Type	Article

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