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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Wu, H.-I. Ji-Shiuan Chen Yuan-Ron Ma Liou, Y. Yeong Der Yao |
| Copyright Year | 1965 |
| Abstract | When demagnetized La /sub 1-x/Sr/sub x/MnO/sub 3/ (LSMO) thin films are magnetized by a local magnetic field from a scanning magnetic tip without an external magnetic field, a magnetic ripple pattern appears on the LSMO surface. The magnetic ripple pattern, consisting of magnetic ripples with varying magnetic periods, is different from the conventional pattern magnetized by an external field. The magnetic ripples with longer magnetic periods have a larger magnitude of magnetic moment. However, the magnitude of the remanent magnetization induced by the magnetic force microscopy (MFM) tip is close to that induced by the external field. Since the MFM images of the magnetic ripples with varying periods can be converted to inverse images and spectra by a fast Fourier transformation (FFT), the inverse FFT images and spectra are also used to probe the magnitude of magnetic moment of the periodic magnetic ripples. |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 3748 |
| Ending Page | 3750 |
| Page Count | 3 |
| File Size | 311047 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 41 |
| Issue Number | 10 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2005-10-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Magnetic fields Magnetic force microscopy Magnetic moments Demagnetization Strontium Magnetic films Magnetization Magnetic forces Image converters Probes magnetic ripple Fast Fourier transformation (FFT) La magnetic force microscopy (MFM) |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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