NDLI: Calibration of Coercive and Stray Fields of Commercial Magnetic Force Microscope Probes

Content Provider	IEEE Xplore Digital Library
Author	Jaafar, M. Asenjo, A. Vazquez, M.
Copyright Year	2002
Abstract	Variable-field magnetic force microscope (MFM) is introduced to characterize the magnetic behavior of commercially available MFM probes that is relevant to interpret MFM imaging. A Nanotec Electronica S.L. microscope has been conveniently modified to apply magnetic fields in axial direction (up to 1.5 kOe) and in-plane direction (up to 2.0 kOe). Axial and transeverse hysteresis loops of the probes have been generated by measuring the changes in the MFM contrast observed when the magnetic field is applied. The variation of the MFM signal is ascribed to the modification of the magnetic state of the tips. This is enabled by the large coercitivity (~1.7 kOe) of the checked longitudinal recording media. The properties of the probes depend on the coating material, the macroscopic tip shape, and tip radius. In only a few cases, the magnetization of the probe can be oriented along in-plane orientation. In addition, the stray field of the tips has been deduced by measuring the influence of the probe in the magnetic state of the checked samples.
Sponsorship	IEEE Nanotechnology Council
Starting Page	245
Ending Page	250
Page Count	6
File Size	547208
File Format	PDF
ISSN	1536125X
Volume Number	7
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-05-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Calibration Magnetic forces Magnetic force microscopy Probes Magnetic field measurement Electron microscopy Magnetic hysteresis Magnetic recording Coatings Magnetic materials stray field Coercive field magnetic force microscopy (MFM) probes MFM probes coercitive field
Content Type	Text
Resource Type	Article
Subject	Nanoscience and Nanotechnology Electrical and Electronic Engineering Computer Science Applications

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