NDLI: Temperature dependence of magnetic properties of AF-biased CoFe films with high FMR

Content Provider	IEEE Xplore Digital Library
Author	Lamy, Y. Viala, B. Prejbeanu, I.L.
Copyright Year	1965
Abstract	We investigate the temperature dependence of static and dynamic magnetic properties of AF/F/AF multilayers consisting in NiMn as AF-layer and Co/sub 90/Fe/sub 10/, Co/sub 50/Fe/sub 50/ and Co/sub 35/Fe/sub 65/ as F-layer, respectively. The T-dependences of the hysteresis loops have been analyzed in relation with the corresponding microwave permeability spectra. The results indicate a lowering of both the exchange bias (Hex) and the anisotropy field (Hk dc) above 150/spl deg/C, in agreement with blocking temperature considerations from literature. However, microwave characterizations show better high temperature stability, with a shift of ferromagnetic resonance frequency less than 20% up to 300/spl deg/C. This reveals a strong discrepancy between the anisotropy field from the static and dynamic measurements including the T-dependence. Finally, this work points out unexpected excellent temperature stability up to 300/spl deg/C proving that such multilayers are available for future use in RF devices at very high frequencies.
Sponsorship	IEEE Magnetics Society
Starting Page	3517
Ending Page	3519
Page Count	3
File Size	176712
File Format	PDF
ISSN	00189464
Volume Number	41
Issue Number	10
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-10-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Temperature dependence Magnetic properties Magnetic films Magnetic resonance Iron Anisotropic magnetoresistance Stability Magnetic multilayers Magnetic hysteresis Permeability ferromagnetic resonance (FMR) Antiferromagnetic (AF) exchange coupling
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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