NDLI: Inspection of intrinsic critical currents for spin-transfer magnetization switching

Content Provider	IEEE Xplore Digital Library
Author	Yagami, K. Tulapurkar, A.A. Fukushima, A. Suzuki, Y.
Copyright Year	1965
Abstract	We examined the relationships between critical current, I/sub c/, and switching time, /spl tau//sub p/, for spin-transfer switching in two regions: (region I) /spl tau//sub p//spl Gt//spl tau//sub 0/, where thermal switching is accompanied and (region II) /spl tau//sub p/< several tens times /spl tau//sub 0/, where /spl tau//sub 0/ is the attempt time for thermal switching (/spl ap/1 ns). We estimated I/sub c0/, defined as the intrinsic I/sub c/ at 0 K, for both regions and confirmed experimentally that those I/sub c0/ coincided with each other at room temperature (RT). The value of I/sub c/ at /spl tau//sub p/=1 ns, measured with microwaves, was approximately 1.6 times the I/sub c0/. This suggested that we use at least two times I/sub c0/ as the writing currents of magnetic memory devices for nsec spin-transfer switching at RT. Although I/sub c0/ for both regions were defined as I/sub c/ at 0 K (I/sub c//sup 0K/) in theory, they showed temperature dependence at low temperatures; \|I/sub c0/\| for region I increased with decreasing temperature, and the estimated I/sub c//sup 0K/ was approximately three times I/sub c0/ for RT. This temperature dependence was quite different from that for region II.
Sponsorship	IEEE Magnetics Society
Starting Page	2615
Ending Page	2617
Page Count	3
File Size	146078
File Format	PDF
ISSN	00189464
Volume Number	41
Issue Number	10
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-10-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Inspection Magnetization Magnetic switching Temperature dependence Writing Microwave measurements Materials science and technology Industrial relations Magnetic materials Critical current temperature dependence magnetic random access memory (MRAM) ns switching spin-transfer switching switching time
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
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7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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