NDLI: Low-temperature growth of perpendicular FePt films

Content Provider	IEEE Xplore Digital Library
Author	Yun-Chung Wu Chih-Huang Lai Chao-Chien Chiang Huang, R.T.
Copyright Year	1965
Abstract	L1/sub 0/ FePt films with high perpendicular coercivity were successfully fabricated by using Cr/sub 65/Mo/sub 15/Mn/sub 20/ underlayers with subsequent forming gas (Ar 95% + H/sub 2/ 5%;) annealing. To adjust the strain energy and the orientation of FePt, Fe and Pt intermediate layers were used. Samples annealed at 275/spl deg/C with thin Pt layers (<5 nm) show relatively small coercivity due to the stabilizing effects from the underlayers. With the increasing thickness of Pt, the strain was locally released and the (111) grains appeared. The nucleation of the ordered L1/sub 0/ FePt phase accompanied the formation of the FePt (111) phase, resulting in a high coercivity but deteriorated perpendicular anisotropy. To maintain the [001] preferred orientation with high coercivity, the sample with a 3.5-nm Pt layer was annealed at 350/spl deg/C. The coercivity as high as 8400 Oe was realized.
Sponsorship	IEEE Magnetics Society
Starting Page	3199
Ending Page	3201
Page Count	3
File Size	489801
File Format	PDF
ISSN	00189464
Volume Number	41
Issue Number	10
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-10-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Annealing Coercive force Perpendicular magnetic recording Plasma temperature Iron Anisotropic magnetoresistance Magnetic films Capacitive sensors Substrates X-ray scattering perpendicular media FePt forming gas annealing
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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