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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Saito, H. van den Bos, A. Abelmann, L. Lodder, J.C. |
| Copyright Year | 1965 |
| Abstract | The transfer functions of tips with various sharpened tip ends were calculated and the resolution of these tips was estimated by considering the resolution limit due to thermal noise at room temperature. The tip having an ellipsoidal tip end (ellipsoidal tip) is found to be a suitable candidate for high-resolution magnetic force microscopy. Sharpening of the flat tip end makes zero signal frequencies disappear for tips with ellipticities larger than tan45/spl deg/. The sensitivity shows a maximum around an ellipticity of tan80/spl deg/. The ellipsoidal tip shows a much smaller tip thickness dependence compared to the tip having a flat tip end because only the tip end mainly contributes to signals in case of the ellipsoidal tip. |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 3447 |
| Ending Page | 3449 |
| Page Count | 3 |
| File Size | 706064 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 39 |
| Issue Number | 5 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2003-09-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Magnetic force microscopy Scanning electron microscopy Signal resolution Magnetic domains Magnetization Signal design Shape Magnetic films Transfer functions Frequency |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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