NDLI: Predicting the long term power loss from cell cracks in PV modules

Content Provider	IEEE Xplore Digital Library
Author	Gade, V. Shiradkar, N. Paggi, M. Opalewski, J.
Copyright Year	2015
Description	Author affiliation: Jabil Circuit Inc., St. Petersburg, FL, USA (Gade, V.; Shiradkar, N.; Opalewski, J.) \|\| IMT Inst. for Adv. Studies Lucca, Lucca, Italy (Paggi, M.)
Abstract	Long term power loss due to cell cracks can become a significant PV wear out mechanism. An experimental framework to assist in predicting the power loss from cell cracks during module service life is presented. The paper is primarily structured around cell crack origin in laminated modules, crack orientation, oriented crack reproduction and climatic testing of custom mini-modules. The results are experimentally verified by a series of accelerated tests involving mechanical load and humidity freeze tests. Periodic characterization using EL and flash I-V are used to study evolution of crack types/categories and performance loss due to cell cracks. Manufacturing modules cell crack data was collected from a population of a week of data post lamination. The data analyzed is for a certain batch of polycrystalline cell modules. Jabil has produced few GW of modules over the past years.
Starting Page	1
Ending Page	6
File Size	1124420
Page Count	6
File Format	PDF
e-ISBN	9781479979448
DOI	10.1109/PVSC.2015.7355665
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-06-14
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Hafnium Reliability Life estimation Solar Cell Cracks PV Module
Content Type	Text
Resource Type	Article

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