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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Simon, D.K. Jordan, P.M. Knaut, M. Chohan, T. Mikolajick, T. Dirnstorfer, I. |
| Copyright Year | 2015 |
| Description | Author affiliation: Nanoelectronic Mater. Lab. gGmbH, Dresden, Germany (Simon, D.K.; Jordan, P.M.; Chohan, T.; Mikolajick, T.; Dirnstorfer, I.) || Inst. fur Halbleiter- und Mikrosystemtechnik, Tech. Univ. Dresden, Dresden, Germany (Knaut, M.) |
| Abstract | $Al_{2}O_{3}$ based nanolaminates provide new functionalities for silicon surface passivation layers in future high-efficient cell concepts. This work presents two different applications: (I) Symmetrical passivation layers for application on p- and n-type Si are realized with thin $HfO_{2}$ and Al-doped $SiO_{2}$ interface layers between $Al_{2}O_{3}$ and Si. These stacks have excellent chemical passivation but zero fixed charges. Consequently, no surface inversion layer is formed in n-type Si and low surface recombination velocities below 2 cm/s are achieved in low injection. (II) Conductive passivation layers are realized with $Al_{2}O_{3}-TiO_{2}$ double and multilayers. The optimum material combination and post deposition treatment results in a current density of 0.5 $mA/cm^{2}$ at 10 mV with a surface recombination velocity of about 15 cm/s. This conductivity is more than eight orders of magnitude higher than for pure $Al_{2}O_{3}.$ |
| Starting Page | 1 |
| Ending Page | 6 |
| File Size | 2775987 |
| Page Count | 6 |
| File Format | |
| e-ISBN | 9781479979448 |
| DOI | 10.1109/PVSC.2015.7356401 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2015-06-14 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Passivation Aluminum oxide Silicon Hafnium compounds Nonhomogeneous media Current density Conductivity interface layer surface passivation charge carrier lifetime Al2O3 ALD fixed charges conductive passivation |
| Content Type | Text |
| Resource Type | Article |
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