NDLI: Improved monitoring and discrimination of batch processes using correspondence analysis

Content Provider	IEEE Xplore Digital Library
Author	Patel, S.R. Gudi, R.D.
Copyright Year	2009
Description	Author affiliation: Research and Technology - Automation Lab in Honeywell Technology Solutions, Bangalore - 560 076, India (Gudi, R.D.) \|\| Honeywell Technology Solutions Lab, Bangalore - 560 076, India (Patel, S.R.)
Abstract	Correspondence analysis (CA) has recently been proposed as a superior alternative to PCA for the tasks of monitoring and early event detection [3]. Some of the key merits of CA include improved discrimination due to the inherent nonlinear scaling as well as the ability to capture and elegantly represent the joint variable-sample associations, which make it amenable to accommodate serial correlations in the data. In this paper, we propose an extension of the CA algorithm to address some of the key problems associated with monitoring of batch processes. The task of batch process supervision is fraught with problems of serial nonlinear correlations in addition to the need to accommodate variable run lengths of the batches. It is shown in the paper that the differential weighting of points in CA offers a unique advantage of representation of the row (sample) and column (variable) points on the same plot (“Bi-plot”), which reveals the prevailing association structure between them. This joint display of observations and variables facilitates the fault diagnosis step and helps to discriminate the batches based on their performance. The paper also uses the traditional DTW for batch synchronization and a simple Euclidean distance based future data filling method during on-line monitoring. The efficacy of the proposed offline and online monitoring method is validated through a simulation study of a penicillin fed-batch fermentation process.
Starting Page	3434
Ending Page	3439
File Size	406102
Page Count	6
File Format	PDF
ISBN	9781424445233
ISSN	07431619
DOI	10.1109/ACC.2009.5160740
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-06-10
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	American Automatic Control Council(AACC)
Subject Keyword	Monitoring Principal component analysis Event detection Fault diagnosis Food manufacturing Manufacturing processes Semiconductor device manufacture Displays Euclidean distance Filling
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
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