NDLI: Simultaneous multi-mode analysis of surface acoustic wave device temperature stability utilizing time-frequency methods

Content Provider	IEEE Xplore Digital Library
Author	Harrison, C.J. Matthews, G.I. Ippolito, S.J. Mohibul Kabir, K.M. Sabri, Y.M.
Copyright Year	2015
Description	Author affiliation: Sch. of Electr. & Comput. Eng., RMIT Univ., Melbourne, VIC, Australia (Harrison, C.J.; Matthews, G.I.) \|\| Centre for Adv. Mater. & Ind. Chem., RMIT Univ., Melbourne, VIC, Australia (Ippolito, S.J.; Mohibul Kabir, K.M.; Sabri, Y.M.)
Abstract	Perturbations in the boundary conditions of Surface Acoustic Wave (SAW) devices are typically quantified through the use of frequency-domain methods, where the device is incorporated as the feedback element in a closed-loop oscillator. While simple in implementation, this method is inherently limited to tracking a single acoustic mode, and discards potentially useful information from the time-domain. In this work an alternative approach utilizing time-frequency methods to extract meaningful information from SAW device transient responses are considered. The advantages of the proposed method are experimentally demonstrated by varying the operating temperature of an XY-cut $LiNbO_{3}$ SAW device. The location in time and frequency of multiple acoustic modes was monitored simultaneously as temperature was varied between 30°C and 150°C. Data from the time-frequency domain demonstrates good agreement with conventional analysis techniques.
Starting Page	1
Ending Page	4
File Size	728797
Page Count	4
File Format	PDF
e-ISBN	9781479981823
DOI	10.1109/ULTSYM.2015.0129
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-10-21
Publisher Place	Taiwan
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Time-frequency analysis Surface acoustic wave devices Oscillators Substrates Data mining Acoustic waves multi-mode analysis time-frequency analysis Surface Acoustic Wave Digital Signal Processing temperature stability
Content Type	Text
Resource Type	Article

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