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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Heron, O. Arnaout, T. Wunderlich, H.-J. |
| Copyright Year | 2005 |
| Description | Author affiliation: Inst. fur Technische Informatik, Univ. Stuttgart, Germany (Heron, O.; Arnaout, T.; Wunderlich, H.-J.) |
| Abstract | Benefits of field programmable gate arrays (FPGAs) have lead to a spectrum of use ranging from consumer products to astronautics. This diversity necessitates the need to evaluate the reliability of the FPGA, because of their high susceptibility to soft errors, which are due to the high density of embedded SRAM cells. Reliability evaluation is an important step in designing highly reliable systems, which results in a strong competitive advantage in today's marketplace. This paper proposes a mathematical model able to evaluate and therefore help to improve the reliability of SRAM-based FPGAs. |
| Starting Page | 403 |
| Ending Page | 408 |
| File Size | 212277 |
| Page Count | 6 |
| File Format | |
| ISBN | 0780393627 |
| DOI | 10.1109/FPL.2005.1515755 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2005-08-24 |
| Publisher Place | Finland |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Field programmable gate arrays Random access memory Single event upset Semiconductor devices Manufacturing processes Packaging Latches Consumer products Mathematical model Failure analysis |
| Content Type | Text |
| Resource Type | Article |
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