NDLI: Terahertz detection of Bacillus thuringiensis spores in $DiPel^{®}$

Content Provider	IEEE Xplore Digital Library
Author	Viveros, L. Weidong Zhang Brown, E.R.
Copyright Year	2013
Description	Author affiliation: Dept. of Environ. Sci., Wright State Univ., Dayton, OH, USA (Viveros, L.) \|\| Depts. of Phys. & Electr. Eng., Wright State Univ., Dayton, OH, USA (Weidong Zhang; Brown, E.R.)
Abstract	Frequency domain terahertz (THz) spectroscopy was used to study $DiPel^{®}$ PRO DF, a commercial insecticide containing 54% Bacillus thuringiensis subsp. kurstaki. The mixture contains Bt spores as well as Bt protein toxins. Microscopic imaging revealed that $DiPel^{®}$ is composed of millimeter scale coarse particles and SEM photos indicate Bt spores are in these particles. The substantial attenuation from transmission measurements suggested strong signal scattering since the dimensions of particles (~1 mm-400 μm) are close to the THz wavelengths (~750-250 μm). Alternatively, periscope reflection measurements were carried out and a 917 GHz absorbance signature was observed. This is explained by the Mie theory that a portion of absorption is accompanied with scattering. Resonant absorption can be excited as long as internal vibration exists within particles. Therefore, absorption can be detected by the reflectivity measurements. To prove this hypothesis, Bt spores were separated from the large $DiPel^{®}$ coarse particles and their presence was again confirmed with microscopy. A transmission scan of the extracted spore samples was then repeated. The 917 GHz absorbance signature was present and consistent with transmissions on culture-grown, freshly harvested Bt spore samples.
Starting Page	1
Ending Page	4
File Size	2266684
Page Count	4
File Format	PDF
ISBN	9781467346429
ISSN	19300395
DOI	10.1109/ICSENS.2013.6688413
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-11-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Absorption Reflection Scanning electron microscopy Scattering Frequency-domain analysis Spectroscopy
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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