NDLI: X-ray pinhole camera measurements

Content Provider	IEEE Xplore Digital Library
Author	Nelson, D.S. Berninger, M.J. Flores, P.A. Good, D.E. Henderson, D.J. Hogge, K.W. Huber, S.R. Lutz, S.S. Mitchell, S.E. Howe, R.A. Mitton, C.V. Molina, I. Bozman, D.R. Cordova, S.R. Mitchell, D.R. Ormond, E.C.
Copyright Year	2013
Description	Author affiliation: Sandia Nat. Labs., Albuquerque, NM, USA (Bozman, D.R.; Cordova, S.R.; Mitchell, D.R.; Ormond, E.C.) \|\| Nat. Security Technol., LLC, Las Vegas, NV, USA (Nelson, D.S.; Berninger, M.J.; Flores, P.A.; Good, D.E.; Henderson, D.J.; Hogge, K.W.; Huber, S.R.; Lutz, S.S.; Mitchell, S.E.; Howe, R.A.; Mitton, C.V.; Molina, I.)
Abstract	The development of the rod pinch diode has lead to high resolution radiography used on contained explosive experiments. The rod pinch diodes use a small diameter anode rod, which extends through a cathode aperture. Electrons borne off the aperture edge can self-insulate and pinch onto the tip of the rod, creating an intense, small x-ray source. This source is utilized as the primary diagnostic on numerous experiments that include high-value, single-shot events. In such applications there is an emphasis on machine reliability, x-ray reproducibility, and x-ray quality. We have observed that an additional pinch occurs at the interface near the anode rod and the rod holder. This suggests that there are stray electrons emitted from the surfaces of the surrounding area. In this paper we present results of x-ray measurements using a pinhole camera. The camera geometry used is an upstream view 30° with respect to the diode centerline. This diagnostic will be employed to: (1) diagnose x-ray reproducibility and quality, and (2) investigate the effect of different diode configurations.
Starting Page	1
Ending Page	1
File Size	110252
Page Count	1
File Format	PDF
ISBN	9781467351713
ISSN	07309244
DOI	10.1109/PLASMA.2013.6635028
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-06-16
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Cameras Anodes Apertures National security Laboratories Abstracts Radiography
Content Type	Text
Resource Type	Article
Subject	Atomic and Molecular Physics, and Optics Condensed Matter Physics Electrical and Electronic Engineering

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
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