NDLI: An optical streak camera diagnostic for observing anode-cathode plasmas for radiographic source development

Content Provider	IEEE Xplore Digital Library
Author	Droemer, D.W. Crain, M.D. Lare, G.A. Johnston, M.D.
Copyright Year	2013
Description	Author affiliation: Las Vegas Oper., Nat. Security Technol., LLC, Las Vegas, NV, USA (Droemer, D.W.; Crain, M.D.; Lare, G.A.) \|\| Sandia Nat. Labs., Albuquerque, NM, USA (Johnston, M.D.)
Abstract	Summary form only given. National Security Technologies, LLC, and Sandia National Laboratories are collaborating in the development of pulsed power-driven flash x-ray radiographic sources that utilize high-intensity electron beam diodes. The RITS 6 (Radiographic Integrated Test Stand) accelerator at Sandia is used to drive a self magnetic pinch diode to produce a Bremsstrahlung x-ray source. The high electric fields and current densities associated with these short A-K gap pinch beam diodes present many challenges in diode development. Plasmas generated at both the anode and cathode affect the diode performance, which is manifested in varying spot (source) sizes, total dose output, and impedance profiles. Understanding the nature of these plasmas including closure rates and densities is important in modeling their behavior and providing insight into their mitigation. In this paper we describe a streak camera-based optical diagnostic that is capable of observing and measuring plasma evolution within the A-K gap. By imaging a region of interest onto the input slit of a streak camera, we are able to produce a time-resolved one-dimensional image of the evolving plasma. Typical data are presented.
Starting Page	1
Ending Page	1
File Size	122606
Page Count	1
File Format	PDF
ISBN	9781467351713
ISSN	07309244
DOI	10.1109/PLASMA.2013.6635018
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-06-16
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Plasmas National security Optical imaging Cameras Laboratories Radiography Optical variables measurement
Content Type	Text
Resource Type	Article
Subject	Atomic and Molecular Physics, and Optics Condensed Matter Physics Electrical and Electronic Engineering

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