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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Avachat, U. Fadong Yan Metacarpa, D. Haldar, P. |
| Copyright Year | 2013 |
| Description | Author affiliation: Coll. of Nanoscale Sci. & Eng. (CNSE), Univ. at Albany - SUNY, Albany, NY, USA (Avachat, U.; Fadong Yan; Metacarpa, D.; Haldar, P.) |
| Abstract | The impact of humidity and temperature on indium doped tin oxide based transparent conducting oxide (TCO) and electrical interconnects were assessed under hot and humid conditions. A review of thin film photovoltaic (PV) literature has shown one major failure mode of cells/modules is associated with the ingress of water into modules in the field. Water contamination has been shown to degrade the performance of the TCO in addition to corroding interconnects and other conductive metals/materials associated with the module. Few interconnects have been tried traditionally however currently the industry needs an alternative to traditional bonding methods which is reliable and has lower manufacturing costs. In this work, the impact of varying TCO process parameters on the thin film stability is studied in a hot and humid environment. Electrically conducting pressure sensitive adhesives have been applied as interconnects which hold manufacturing advantages. The stability of laminated TCO and interconnects is studied under hot and humid conditions and an optimized TCO layer and interconnect structure is proposed for a laminated CIGS module. A method for evaluation of TCO, interconnect, lamination materials and processes have been established to support qualification for the use in CIGS manufacturing. |
| Sponsorship | IEEE Electron Devices Soc. |
| Starting Page | 2983 |
| Ending Page | 2986 |
| File Size | 288962 |
| Page Count | 4 |
| File Format | |
| DOI | 10.1109/PVSC.2013.6745089 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2013-06-16 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Resistance Glass Degradation Indium tin oxide Films Photovoltaic cells Thermal stability pressure sensitive adhesives thin film solar cells transparent conducting oxides reliability interconnects |
| Content Type | Text |
| Resource Type | Article |
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