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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Beyer, H.G. Saetre, T.O. Yordanov, G.H. |
| Copyright Year | 2013 |
| Description | Author affiliation: Dept. of Eng., Univ. of Agder, Grimstad, Norway (Beyer, H.G.; Saetre, T.O.; Yordanov, G.H.) |
| Abstract | aSi modules show large variations in their response to the incoming irradiance as measured by broad-band irradiance sensors, making the check and prediction of their performance difficult when only broad-band data are available. One approach to overcome this difficulty is given by the use of detailed models to estimate the irradiance spectra from the broad-band data. Here, it is tested to what degree the detailed modeling could be substituted by a semi-empirical approach to reflect the modules response based on but the information on direct and diffuse irradiance and solar geometry. The model performance is measured by its capability to give the correct monthly mean short-circuit current together with a reasonable $R^{2}$ value of the scatter of modeled and measured data. A first test of a respective model has shown reasonable results. |
| Sponsorship | IEEE Electron Devices Soc. |
| Starting Page | 0751 |
| Ending Page | 0753 |
| File Size | 225487 |
| Page Count | 3 |
| File Format | |
| DOI | 10.1109/PVSC.2013.6744258 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2013-06-16 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Data models Atmospheric modeling Short-circuit currents Broadband communication Current measurement Educational institutions Integrated circuit modeling short-circuit current amorphous silicon |
| Content Type | Text |
| Resource Type | Article |
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